Advanced Characterization Techniques Applied to Minerals, Metals and Materials

Chair(s): R. Gauvin, McGill University - D. Paktunc, CANMET

Technical Program schedule is subject to change.
Final program will be posted as of July 1, 2008.

This symposium will present advanced techniques for the characterization of the microstructure of minerals, metals and materials including ceramics, polymers, nano and bio materials. This workshop is intended to cover the following techniques: Field Emission Scanning Electron Microscopy, Field Emission Transmission Electron Microscopy, X-Ray Microanalysis, X-Ray Diffraction, Image Analysis, Auger Spectroscopy, X-ray Photoelectron Spectroscopy (XPS), Secondary Ion Mass Spectroscopy (SIMS), Scanning Tunneling Microscopy (STM), Atomic Force Microscopy (AFM), Focus Ion Beam (FIB), Three Dimensional Atom Probe Tomography, Synchrotron-EXAFS, Neutron Activation and any other characterization technique that is of relevant interest.

PROCEEDINGS

The proceedings of the symposium will be published in CD form and will be available at the meeting.  All papers will be refereed and edited prior to final acceptance and publication.

Contact:

Raynald Gauvin
Dept. of Mining, Metals & Materials Eng.
McGill University
M.H. Wong Building
3610 University Street
Montréal, Québec, H3A 2B2, Canada
Email: raynald.gauvin@mcgill.ca

Stewart McIntyre
Surface Science Centre,
University of Western Ontario
Email: smcintyr@uwo.ca

Sponsored by: The Metallurgical Society of CIM